{"product_id":"9783031014246","title":"Hf-Based High-k Dielectrics : Process Development, Performance Characterization, and Reliability (Synthesis Lectures on Solid State Materials and Devices) (2007. x, 92 S. X, 92 p. 235 mm)","description":"\u003cp\u003eHard breakdown and soft breakdown, particularly the Weibull slopes, were studied under constant voltage stress. The origin of soft breakdown (first breakdown) was studied and the results suggested that the soft breakdown may be due to one layer breakdown in the bilayer structure (HfO2\/SiO2: 4 nm\/4 nm).\u003c\/p\u003e","brand":"SPRINGER, BERLIN; SPRINGER INTERNATIONAL PUBLISHING;","offers":[{"title":"Default Title","offer_id":42566533939275,"sku":"00000_00000_00000_00000","price":1069.24,"currency_code":"THB","in_stock":true}],"url":"https:\/\/kinokuniya.co.th\/products\/9783031014246","provider":"Books Kinokuniya Thailand","version":"1.0","type":"link"}