{"product_id":"9780123739735","title":"System-on-Chip Test Architectures : Nanometer Design for Testability (Systems on Silicon)","description":"\u003cp\u003eA guide to VLSI Testing and Design-for-Testability techniques that allows students, researchers, DFT practitioners, and VLSI designers to master System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog\/mixed-signal designs. It also includes practical problems at the end of each chapter for students.\u003c\/p\u003e","brand":"Morgan Kaufmann Publishers In","offers":[{"title":"Default Title","offer_id":42962285002827,"sku":"00000_00000_00000_00000","price":3028.75,"currency_code":"THB","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0641\/0023\/7387\/files\/9780123739735-1.jpg?v=1785578675","url":"https:\/\/kinokuniya.co.th\/th\/products\/9780123739735","provider":"Books Kinokuniya Thailand","version":"1.0","type":"link"}